Scanning Probe Microscopes for Special Applications

There are many applications, where a standard scanning probe microscope can not fullfill the requirements. This can be the case when surface characterization should take place under certain environmental conditions or when special experiments have to be conducted.

The image above show two special setups:

• The system on the left is a special version of a UHV Scanning Tunnelling Microscope. This system allows conducting tip enhanced raman spectroscopy (TERS) measurements which having an optimal numerical aperture for the optical signal. The whole half-sphere around the sample surface is surrounded by a concave mirror. (For further information see here...).
• The right instrument is a CAHT, a Controlled Atmosphere High Temperature AFM. This AFM supports measurement on hot samples up to 800°C.

Both systems required a fully new construction of the scanner, as these specifications could not be met by any standard system.

Further special applications come from the area of Scanning Nearfield Optical Microscopy (SNOM). The AFM scanners of the series DS 45 and DS 95 are available as SNOM versions. Instead of a cantilever, they use the sharpened end of an optical fiber as a scanning tip, which allows optical excitation and detection below the physical diffraction limit. These scanners are shear-force-microscope scanner, where the tip oscillates parallel to the sample surface. Depending on the type of SNOM experiment, many different measurement setups are possible. For further information, please contact us.

A further categorie of special instruments are electrochemical STMs. These systems are designed for single atomic resolution and work in liquid as well as in air, and are used for electrochemical investigation of surfaces. Also in this case, please contact us for further information.

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