The most commonly used instrument of the Scanning Probe Microscopes (SPM) is the AFM (Atomic Force Microscope). With such an instrument, almost any surface can be scanned mechanically with a high resolution. Actually, most of the information given here concerns AFM microscopes.
Common fundamentals about AFM microscopy:
Our videos show how to work with the different instruments in various applications.
- There are a variety of applications, so we have gathered some examples of applications.
- One of the most important, and quite often neglected, aspects of the work with AFM microscopes is the sample surface preparation: Influences on Scanning Probe Microscopy from surface contamination layers.
Comparing AFM images with Scanning Electron Microscope (SEM) images, the AFM images often look dull and without contrast, because AFM images designate the true height information, whereas the lighting in the SEM is selected so that the image will "look good".