DME - AFM Systems

The following DME Atomic Force Microscopes are based on the DualScope™ DS 95 Scanner series with following properties:

	Probe scanner layout: Only the tip moves during scanning. This allows investigation of arbitrary sample types, measurement results are independent of scame size and mass Built-in optical axis with microscope objective for rough positioning Can be operated in any orientation Full automatic approach by DME's specialized axial piezo motor Approach independent of surface and its properties Fool-proof tip exchange within seconds Supports nearly all AFM measurement modes Details... Demo video: Atomic Force Microscopy on Graphite and an iPhone
	Our most compact system for samples up to approx. 3 mm thickness. This setup belongs to the most compact system on the market and due to its small size provides unbeaten stability against external noise and vibration. The system is perfectly suited for places with limited space e.g. in clean rooms. Because of its easy handling, the system can be operated in a standard glove box. Details...
	Our system with a compact granite provides free side view to the sample and allows up to 50 mm height and 150 mm width. The free side access supports complex measurement setups e.g. for electrical measurements or optical measurements like SNOM. The built-in XY table supports XY movements of 15 mm. Details...
	Our largest system is designed for full automatic operation and sample diameters up to 300 m. It can be equipped with optical references for positioning and then allows absolute positioning better than 300 nm at a full movement range of more than 150 mm. The granite stage also supports mouning of a further measurement head, e.g. an optical measurement microscope or a nano indenter. In that case, the same place on the sample can be evaluated with a single button press by two different methods. Together with our ScanTool™ SPM software the system supports full automatic and free customizeable measurement, analysis and reporting. Details...

All our scanning probe microscopes are used together with our fully digital C26 controller and our scan software DME ScanTool(TM) Alle unsere Rastersondenmikroskope benötigen unseren volldigitalen C26-Controller, sowie unsere aktuelle ScanSoftware DME ScanTool. There exist many addons to our instruments, depending on the type of desired measurement. One example is our FPGA based Lock-In combination device DME DiProWa, which supports various electrical measurements like Kelvin-Probe-Force-Microscopy (KFPM). Please tell us your concrete applications and we will choose the optimal set of add ons for your AFM.

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